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  • Evidence for Direct Ionization Induced Field Evaporation of an SrTiO3-containing Perovskite Oxide Superstructure

    Friday, November 1, 2024

    This webinar discusses ORNL's persovskite research Perovskite superstructures were run using a 4.7 eV laser on the LEAP6000, and the specimen yield was astonishing. This webinar will discuss ORNL's persovskite research; evidence for laser induced ionization as the dominate trigger for field evaporation for this particular perovskite oxide will be presented.

    ↓ ON DEMAND HERE

  • Advancing APT specimen preparation via fs-laser processing utilizing 3D-Micromac’s microPREP® PRO FEMTO

    Thursday, May 2, 2024

    Join us to discover how femtosecond laser ablation is revolutionizing APT specimen preparation, reducing complexity and cost while enabling advanced correlative analyses.

    ↓ ON DEMAND HERE

  • Atom Probe Tomography for Semiconductor Applications

    Tuesday, March 19, 2024

    Semiconductor development in 2024 and beyond is crucial as it underpins advancements in various cutting-edge technologies such as artificial intelligence, quantum computing, and 5G communication networks.. In this webinar, CAMECA’s Katherine discuss the important role of atom probe tomography (APT) in the development and manufacture of next-generation semiconductors.

    ↓ ON DEMAND HERE

  • AP SUITE 6.3.1: Functions and Features in the Latest Release

    Friday, February 9, 2024

    See what's new in this latest version of AP Suite.

    ↓ ON DEMAND HERE

  • Yield Assessment of Protective Coatings for Atom Probe Analysis

    Tuesday, February 6, 2024

    Join Dr. Yimeng Chen and Dr. Katherine Rice to explore the impact of protective cap materials in atom probe tomography and discover which conditions improve sample survivability.

    ↓ ON DEMAND HERE